TY - GEN
T1 - Alignment tolerances for off-plane reflection grating spectrometry
T2 - Optics for EUV, X-Ray, and Gamma-Ray Astronomy VI
AU - Allured, Ryan
AU - Donovan, Benjamin D.
AU - McEntaffer, Randall L.
PY - 2013
Y1 - 2013
N2 - Off-plane reflection gratings can be used to provide high throughput and spectral resolution in the 0.3-2.0 keV band, allowing for unprecedented diagnostics of energetic astrophysical processes. A grating spectrometer consists of multiple aligned gratings intersecting the converging beam of a Wolter-I telescope. Each grating will be aligned such that the diffracted spectra overlap at the focal plane. Misalignments will degrade both spectral resolution and effective area. In this paper we present a summary of analytical alignment tolerance calculations, including an investigation of diffraction efficiency alignment dependence. Our plan for extending this work to future modeling and simulation is laid out. Finally, we report on the status of laboratory techniques to achieve these tolerances for flight-like optics.
AB - Off-plane reflection gratings can be used to provide high throughput and spectral resolution in the 0.3-2.0 keV band, allowing for unprecedented diagnostics of energetic astrophysical processes. A grating spectrometer consists of multiple aligned gratings intersecting the converging beam of a Wolter-I telescope. Each grating will be aligned such that the diffracted spectra overlap at the focal plane. Misalignments will degrade both spectral resolution and effective area. In this paper we present a summary of analytical alignment tolerance calculations, including an investigation of diffraction efficiency alignment dependence. Our plan for extending this work to future modeling and simulation is laid out. Finally, we report on the status of laboratory techniques to achieve these tolerances for flight-like optics.
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U2 - 10.1117/12.2022873
DO - 10.1117/12.2022873
M3 - Conference contribution
AN - SCOPUS:84886844782
SN - 9780819497116
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Optics for EUV, X-Ray, and Gamma-Ray Astronomy VI
Y2 - 26 August 2013 through 29 August 2013
ER -