Abstract
We report an Al0.3Ga0.7N/Al0.05Ga 0.95N/GaN composite-channel HEMT with enhanced linearity. Through channel engineering, i.e. inserting a 6-nm thick AlGaN layer with 5% Al composition in the channel region, a composite-channel HEMT was demonstrated. Transconductance and cutoff frequencies of a 1 μm × 100 μm HEMT are kept near their peak values throughout the low- and high-current operating levels, a desirable feature for linear power amplifiers. Driven by W-CDMA signals with a center frequency of 2 GHz, an adjacent channel leakage ratio (ACLR) of less than -45 dBc was achieved with a power added efficiency (PAE) of 45% and a power density of 3.4 W/mm for composite-channel HEMTs (CC-HEMTs) grown on sapphire substrates, without using any linearization techniques.
Original language | English (US) |
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Pages (from-to) | 811-814 |
Number of pages | 4 |
Journal | Technical Digest - International Electron Devices Meeting, IEDM |
State | Published - 2004 |
Event | IEEE International Electron Devices Meeting, 2004 IEDM - San Francisco, CA, United States Duration: Dec 13 2004 → Dec 15 2004 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Materials Chemistry
- Electrical and Electronic Engineering