Abstract
This article investigates the possible use of our newly defined extended projection depth (abbreviated to EPD) in nonparametric discriminant analysis. We propose a robust nonparametric classifier, which relies on the intuitively simple notion of EPD. The EPD-based classifier assigns an observation to the population with respect to which it has the maximum EPD. Asymptotic properties of misclassification rates and robust properties of EPD-based classifier are discussed. A few simulated data sets are used to compare the performance of EPD-based classifier with Fisher's linear discriminant rule, quadratic discriminant rule, and PD-based classifier. It is also found that when the underlying distributions are elliptically symmetric, EPD-based classifier is asymptotically equivalent to the optimal Bayes classifier.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2276-2290 |
| Number of pages | 15 |
| Journal | Communications in Statistics - Theory and Methods |
| Volume | 37 |
| Issue number | 14 |
| DOIs | |
| State | Published - Jan 2008 |
All Science Journal Classification (ASJC) codes
- Statistics and Probability
Fingerprint
Dive into the research topics of 'An extended projection data depth and its applications to discrimination'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver