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An improved in-based ohmic contact to n-GaSb
J. A. Robinson
,
S. E. Mohney
Materials Science and Engineering
Materials Research Institute (MRI)
Research output
:
Contribution to journal
›
Article
›
peer-review
8
Scopus citations
Overview
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Engineering & Materials Science
Ohmic contacts
100%
Contact resistance
76%
Surface morphology
37%
Transmission electron microscopy
33%
Annealing
32%
Semiconductor materials
29%
Characterization (materials science)
29%
Metals
21%
Temperature
13%
Chemical Compounds
Contact Resistance
83%
Drop
28%
Annealing
26%
Semiconductor
25%
Transmission Electron Microscopy
21%
Metal
14%
Surface
10%
Physics & Astronomy
contact resistance
69%
electric contacts
58%
annealing
19%
characterization
18%
metals
16%
temperature
9%