Abstract
The University of Colorado maintains a grating evaluation facility to characterize optics from the far ultraviolet to the X-ray. The newest addition to this facility is a novel X-ray monochromator. Light is generated by a Manson electron impact X-ray source and passes through a monochromator which incorporates a grating in the off-plane mount at grazing incidence followed by an aluminum filter. From here, the light enters another vacuum chamber to illuminate the test grating, which disperses light onto a resistive anode MCP. This monochromator is characterized utilizing a variety of source anodes and voltages. Preliminary results from a high density test grating, also in the off-plane mount, display that this system is a highly effective tool for determining grating efficiencies.
Original language | English (US) |
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Pages (from-to) | 499-507 |
Number of pages | 9 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 5168 |
DOIs | |
State | Published - 2004 |
Event | Optics for EUV, X-Ray, and Gamma-Ray Astronomy - San Diego, CA, United States Duration: Aug 4 2003 → Aug 7 2003 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering