Analysis of liposome model systems by timeofflight secondary ion mass spectrometry

Jelena Lovrić; Jacqueline D. Keighron; Tina B. Angerer; Xianchan Li; Per Malmberg; John S. Fletcher; Andrew G. Ewing

doi:10.1002/sia.5623

Analysis of liposome model systems by timeofflight secondary ion mass spectrometry

Jelena Lovrić, Jacqueline D. Keighron, Tina B. Angerer, Xianchan Li, Per Malmberg, John S. Fletcher, Andrew G. Ewing

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is an important technique for studying chemical composition of micrometer scale objects because of its high spatial resolution imaging capabilities and chemical specificity. In this work, we focus on the application of ToF-SIMS to gain insight into the chemistry of micrometer size liposomes as a potential model for neurotransmitter vesicles. Two models of giant liposomes were analyzed: histamine and aqueous two-phase systemcontaining liposomes. Characterization of the internal structure of single fixed liposomes was carried out both with the Bi₃ ⁺ and C₆₀ ⁺ ion sources. The depth profiling capability of ToF-SIMS was used to investigate the liposome interior.

Original language	English (US)
Pages (from-to)	74-78
Number of pages	5
Journal	Surface and Interface Analysis
Volume	46
Issue number	S1
DOIs	https://doi.org/10.1002/sia.5623
State	Published - Nov 1 2014

All Science Journal Classification (ASJC) codes

Chemistry(all)
Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1002/sia.5623

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title = "Analysis of liposome model systems by timeofflight secondary ion mass spectrometry",

abstract = "Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is an important technique for studying chemical composition of micrometer scale objects because of its high spatial resolution imaging capabilities and chemical specificity. In this work, we focus on the application of ToF-SIMS to gain insight into the chemistry of micrometer size liposomes as a potential model for neurotransmitter vesicles. Two models of giant liposomes were analyzed: histamine and aqueous two-phase systemcontaining liposomes. Characterization of the internal structure of single fixed liposomes was carried out both with the Bi3 + and C60 + ion sources. The depth profiling capability of ToF-SIMS was used to investigate the liposome interior.",

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AU - Lovrić, Jelena

AU - Keighron, Jacqueline D.

AU - Angerer, Tina B.

AU - Li, Xianchan

AU - Malmberg, Per

AU - Fletcher, John S.

AU - Ewing, Andrew G.

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AB - Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is an important technique for studying chemical composition of micrometer scale objects because of its high spatial resolution imaging capabilities and chemical specificity. In this work, we focus on the application of ToF-SIMS to gain insight into the chemistry of micrometer size liposomes as a potential model for neurotransmitter vesicles. Two models of giant liposomes were analyzed: histamine and aqueous two-phase systemcontaining liposomes. Characterization of the internal structure of single fixed liposomes was carried out both with the Bi3 + and C60 + ion sources. The depth profiling capability of ToF-SIMS was used to investigate the liposome interior.

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Analysis of liposome model systems by timeofflight secondary ion mass spectrometry

Abstract

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