Analysis of silver columnar thin films by atomic force microscopy

Fatima Benkabou; Akhlesh Lakhtakia

doi:10.1117/12.796212

Analysis of silver columnar thin films by atomic force microscopy

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Analyses of the top-surface morphology of columnar thin films (CTFs) of silver, grown by a combination of the usual oblique-angle-deposition technique with very fast substrate rotation, confirm that silver CTFs consist of more isolated and quasiperiodically distributed nanowires for higher vapor incidence angle during deposition. The top surfaces then are well-suited for the exploitation of surface-enhanced Raman scattering and localized surface-plasmon resonance.

Original language	English (US)
Title of host publication	Nanostructured Thin Films
DOIs	https://doi.org/10.1117/12.796212
State	Published - Nov 21 2008
Event	Nanostructured Thin Films - San Diego, CA, United States Duration: Aug 13 2008 → Aug 14 2008

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	7041
ISSN (Print)	0277-786X

Other

Other	Nanostructured Thin Films
Country/Territory	United States
City	San Diego, CA
Period	8/13/08 → 8/14/08

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.796212

Cite this

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title = "Analysis of silver columnar thin films by atomic force microscopy",

abstract = "Analyses of the top-surface morphology of columnar thin films (CTFs) of silver, grown by a combination of the usual oblique-angle-deposition technique with very fast substrate rotation, confirm that silver CTFs consist of more isolated and quasiperiodically distributed nanowires for higher vapor incidence angle during deposition. The top surfaces then are well-suited for the exploitation of surface-enhanced Raman scattering and localized surface-plasmon resonance.",

author = "Fatima Benkabou and Akhlesh Lakhtakia",

year = "2008",

month = nov,

day = "21",

doi = "10.1117/12.796212",

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isbn = "9780819472618",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

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AU - Benkabou, Fatima

AU - Lakhtakia, Akhlesh

PY - 2008/11/21

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N2 - Analyses of the top-surface morphology of columnar thin films (CTFs) of silver, grown by a combination of the usual oblique-angle-deposition technique with very fast substrate rotation, confirm that silver CTFs consist of more isolated and quasiperiodically distributed nanowires for higher vapor incidence angle during deposition. The top surfaces then are well-suited for the exploitation of surface-enhanced Raman scattering and localized surface-plasmon resonance.

AB - Analyses of the top-surface morphology of columnar thin films (CTFs) of silver, grown by a combination of the usual oblique-angle-deposition technique with very fast substrate rotation, confirm that silver CTFs consist of more isolated and quasiperiodically distributed nanowires for higher vapor incidence angle during deposition. The top surfaces then are well-suited for the exploitation of surface-enhanced Raman scattering and localized surface-plasmon resonance.

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DO - 10.1117/12.796212

M3 - Conference contribution

AN - SCOPUS:56249109429

SN - 9780819472618

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Nanostructured Thin Films

T2 - Nanostructured Thin Films

Y2 - 13 August 2008 through 14 August 2008

ER -

Analysis of silver columnar thin films by atomic force microscopy

Abstract

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All Science Journal Classification (ASJC) codes

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