Angle and energy distributions of neutral atoms sputtered from Ni3Al(100)

Bruce V. King, C. Zimmermann, Donald E. Riederer, Scott W. Rosencrance, Barbara J. Garrison, Nicholas Winograd

Research output: Contribution to journalArticlepeer-review

12 Scopus citations


The energy and angular distributions of Ni and Al atoms sputtered from Ni3Al(100) by 8 keV Ar+ have been measured using multiphoton resonance ionization detection. The Al atoms, which originate entirely from the top atomic layer of Ni3Al(100), are predominantly sputtered along close packed <110> directions. On the other hand the sputtered Ni flux, which arises from both the first and second layers, has a large component normal to the surface. Molecular dynamics computer simulations agree well with experimental results and suggest that the normal emission of Ni atoms arises primarily from second-layer atoms.

Original languageEnglish (US)
Pages (from-to)1236-1240
Number of pages5
JournalRapid Communications in Mass Spectrometry
Issue number18
StatePublished - 1998

All Science Journal Classification (ASJC) codes

  • Analytical Chemistry
  • Spectroscopy
  • Organic Chemistry


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