Annular dark field imaging in a TEM

S. Bals, B. Kabius, M. Haider, V. Radmilovic, C. Kisielowski

Research output: Contribution to journalArticlepeer-review

49 Scopus citations


Annular objective apertures are fabricated for a CM300 transmission electron microscope using a focused ion beam system. A central beam stop in the back focal plane of the objective lens of the microscope blocks all electrons scattered up to a semi-angle of approximately 20mrad. In this manner, contributions to the image from Bragg scattering are largely reduced and the image contrast is sensitive to the atomic number Z. Experimentally, we find that single atom scattering cross sections measured with this technique are close to Rutherford scattering values. A comparison between this new method and STEM-HAADF shows that both techniques result in qualitatively similar images although the resolution of ADF-TEM is limited by contrast delocalization caused by the spherical aberration of the objective lens. This problem can be overcome by using an aberration corrected microscope. Published by Elsevier Ltd.

Original languageEnglish (US)
Pages (from-to)675-680
Number of pages6
JournalSolid State Communications
Issue number10
StatePublished - Jun 2004

All Science Journal Classification (ASJC) codes

  • General Chemistry
  • Condensed Matter Physics
  • Materials Chemistry


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