Anomalous Confinement Slows Surface Fluctuations of Star Polymer Melt Films

Fan Zhang; Qiming He; Yang Zhou; Suresh Narayanan; Chao Wang; Bryan D. Vogt; Mark D. Foster

doi:10.1021/acsmacrolett.8b00278

Anomalous Confinement Slows Surface Fluctuations of Star Polymer Melt Films

Fan Zhang, Qiming He, Yang Zhou, Suresh Narayanan, Chao Wang, Bryan D. Vogt, Mark D. Foster

Chemical Engineering

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

The unusually large film thickness at which confinement effects manifest themselves in surface fluctuations of unentangled four-arm star polymers has been defined using film thicknesses from 10R_g to 107R_g. For 15k four-arm star polystyrene (SPS), confinement appears at a thickness between 112 nm (40R_g) and 72 nm (26R_g), which is remarkably larger than the thicknesses at which confinement appears for unentangled 6k linear (<15 nm, <7R_g) and 6k and 14k cyclic (24 and 22 nm, respectively) polystyrenes. Data for 15k star films can be rationalized using a two-layer model with a 17 nm (6R_g) thick highly viscous layer at the substrate, which is significantly thicker than the 1R_g thick "irreversibly adsorbed" layer. For a 29 nm (10R_g) thick film, more striking confinement occurs due to the combined influence of both interfaces. These results underscore the extraordinary role long-chain branching plays in dictating surface fluctuations of thin films.

Original language	English (US)
Pages (from-to)	834-839
Number of pages	6
Journal	ACS Macro Letters
Volume	7
Issue number	7
DOIs	https://doi.org/10.1021/acsmacrolett.8b00278
State	Published - Jul 17 2018

All Science Journal Classification (ASJC) codes

Organic Chemistry
Polymers and Plastics
Inorganic Chemistry
Materials Chemistry

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10.1021/acsmacrolett.8b00278

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@article{9b046f0754094280981500ee52e99f24,

title = "Anomalous Confinement Slows Surface Fluctuations of Star Polymer Melt Films",

abstract = "The unusually large film thickness at which confinement effects manifest themselves in surface fluctuations of unentangled four-arm star polymers has been defined using film thicknesses from 10Rg to 107Rg. For 15k four-arm star polystyrene (SPS), confinement appears at a thickness between 112 nm (40Rg) and 72 nm (26Rg), which is remarkably larger than the thicknesses at which confinement appears for unentangled 6k linear (<15 nm, <7Rg) and 6k and 14k cyclic (24 and 22 nm, respectively) polystyrenes. Data for 15k star films can be rationalized using a two-layer model with a 17 nm (6Rg) thick highly viscous layer at the substrate, which is significantly thicker than the 1Rg thick {"}irreversibly adsorbed{"} layer. For a 29 nm (10Rg) thick film, more striking confinement occurs due to the combined influence of both interfaces. These results underscore the extraordinary role long-chain branching plays in dictating surface fluctuations of thin films.",

author = "Fan Zhang and Qiming He and Yang Zhou and Suresh Narayanan and Chao Wang and Vogt, {Bryan D.} and Foster, {Mark D.}",

note = "Publisher Copyright: Copyright {\textcopyright} 2018 American Chemical Society.",

year = "2018",

month = jul,

day = "17",

doi = "10.1021/acsmacrolett.8b00278",

language = "English (US)",

volume = "7",

pages = "834--839",

journal = "ACS Macro Letters",

issn = "2161-1653",

publisher = "American Chemical Society",

number = "7",

}

TY - JOUR

T1 - Anomalous Confinement Slows Surface Fluctuations of Star Polymer Melt Films

AU - Zhang, Fan

AU - He, Qiming

AU - Zhou, Yang

AU - Narayanan, Suresh

AU - Wang, Chao

AU - Vogt, Bryan D.

AU - Foster, Mark D.

PY - 2018/7/17

Y1 - 2018/7/17

N2 - The unusually large film thickness at which confinement effects manifest themselves in surface fluctuations of unentangled four-arm star polymers has been defined using film thicknesses from 10Rg to 107Rg. For 15k four-arm star polystyrene (SPS), confinement appears at a thickness between 112 nm (40Rg) and 72 nm (26Rg), which is remarkably larger than the thicknesses at which confinement appears for unentangled 6k linear (<15 nm, <7Rg) and 6k and 14k cyclic (24 and 22 nm, respectively) polystyrenes. Data for 15k star films can be rationalized using a two-layer model with a 17 nm (6Rg) thick highly viscous layer at the substrate, which is significantly thicker than the 1Rg thick "irreversibly adsorbed" layer. For a 29 nm (10Rg) thick film, more striking confinement occurs due to the combined influence of both interfaces. These results underscore the extraordinary role long-chain branching plays in dictating surface fluctuations of thin films.

AB - The unusually large film thickness at which confinement effects manifest themselves in surface fluctuations of unentangled four-arm star polymers has been defined using film thicknesses from 10Rg to 107Rg. For 15k four-arm star polystyrene (SPS), confinement appears at a thickness between 112 nm (40Rg) and 72 nm (26Rg), which is remarkably larger than the thicknesses at which confinement appears for unentangled 6k linear (<15 nm, <7Rg) and 6k and 14k cyclic (24 and 22 nm, respectively) polystyrenes. Data for 15k star films can be rationalized using a two-layer model with a 17 nm (6Rg) thick highly viscous layer at the substrate, which is significantly thicker than the 1Rg thick "irreversibly adsorbed" layer. For a 29 nm (10Rg) thick film, more striking confinement occurs due to the combined influence of both interfaces. These results underscore the extraordinary role long-chain branching plays in dictating surface fluctuations of thin films.

UR - http://www.scopus.com/inward/record.url?scp=85050204967&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85050204967&partnerID=8YFLogxK

U2 - 10.1021/acsmacrolett.8b00278

DO - 10.1021/acsmacrolett.8b00278

M3 - Article

C2 - 35650756

AN - SCOPUS:85050204967

SN - 2161-1653

VL - 7

SP - 834

EP - 839

JO - ACS Macro Letters

JF - ACS Macro Letters

IS - 7

ER -

Anomalous Confinement Slows Surface Fluctuations of Star Polymer Melt Films

Abstract

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