Anomalous crack arrays in anisotropic-strained manganite on scandate substrates

Changcheng Ju; Fei Xue; Fengzhen Huang; Long Qing Chen; Xiaomei Lu; Jinsong Zhu; Henrik Myhre Jensen

doi:10.1063/1.4921522

Anomalous crack arrays in anisotropic-strained manganite on scandate substrates

Changcheng Ju, Fei Xue, Fengzhen Huang, Long Qing Chen, Xiaomei Lu, Jinsong Zhu, Henrik Myhre Jensen

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

We report that when (La,Sr)MnO₃ films grown on orthorhombic (110)_o DyScO₃ (DSO) substrates once reach a critical thickness, anisotropic patterned cracks are introduced which propagate parallel to [1-10]_o direction. The typical surface morphology and cross-sectional TEM are examined in order to clarify the formation of these cracks. The cause of crack propagation through the film and into the substrate is identified as the underlying large anisotropic strain and relatively low stiffness of DSO substrates. The electrical conduction in the crack region is found to be several orders of magnitude higher than that in the uncracked areas of the film. The energy dispersive x-ray-verified La_0.7Sr_0.3MnO₃ deposited into cracks may be responsible for the anomalous conducting behaviors. Finally, a simple model is constructed for estimating substrate fracture toughness and calculating an upper bound of film fracture toughness.

Original language	English (US)
Article number	201905
Journal	Applied Physics Letters
Volume	106
Issue number	20
DOIs	https://doi.org/10.1063/1.4921522
State	Published - May 18 2015

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.4921522

Cite this

@article{5117791952424b458da6cb9f2aa2e66d,

title = "Anomalous crack arrays in anisotropic-strained manganite on scandate substrates",

abstract = "We report that when (La,Sr)MnO3 films grown on orthorhombic (110)o DyScO3 (DSO) substrates once reach a critical thickness, anisotropic patterned cracks are introduced which propagate parallel to [1-10]o direction. The typical surface morphology and cross-sectional TEM are examined in order to clarify the formation of these cracks. The cause of crack propagation through the film and into the substrate is identified as the underlying large anisotropic strain and relatively low stiffness of DSO substrates. The electrical conduction in the crack region is found to be several orders of magnitude higher than that in the uncracked areas of the film. The energy dispersive x-ray-verified La0.7Sr0.3MnO3 deposited into cracks may be responsible for the anomalous conducting behaviors. Finally, a simple model is constructed for estimating substrate fracture toughness and calculating an upper bound of film fracture toughness.",

author = "Changcheng Ju and Fei Xue and Fengzhen Huang and Chen, {Long Qing} and Xiaomei Lu and Jinsong Zhu and Jensen, {Henrik Myhre}",

note = "Publisher Copyright: {\textcopyright} 2015 AIP Publishing LLC.",

year = "2015",

month = may,

day = "18",

doi = "10.1063/1.4921522",

language = "English (US)",

volume = "106",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "20",

}

TY - JOUR

T1 - Anomalous crack arrays in anisotropic-strained manganite on scandate substrates

AU - Ju, Changcheng

AU - Xue, Fei

AU - Huang, Fengzhen

AU - Chen, Long Qing

AU - Lu, Xiaomei

AU - Zhu, Jinsong

AU - Jensen, Henrik Myhre

PY - 2015/5/18

Y1 - 2015/5/18

N2 - We report that when (La,Sr)MnO3 films grown on orthorhombic (110)o DyScO3 (DSO) substrates once reach a critical thickness, anisotropic patterned cracks are introduced which propagate parallel to [1-10]o direction. The typical surface morphology and cross-sectional TEM are examined in order to clarify the formation of these cracks. The cause of crack propagation through the film and into the substrate is identified as the underlying large anisotropic strain and relatively low stiffness of DSO substrates. The electrical conduction in the crack region is found to be several orders of magnitude higher than that in the uncracked areas of the film. The energy dispersive x-ray-verified La0.7Sr0.3MnO3 deposited into cracks may be responsible for the anomalous conducting behaviors. Finally, a simple model is constructed for estimating substrate fracture toughness and calculating an upper bound of film fracture toughness.

AB - We report that when (La,Sr)MnO3 films grown on orthorhombic (110)o DyScO3 (DSO) substrates once reach a critical thickness, anisotropic patterned cracks are introduced which propagate parallel to [1-10]o direction. The typical surface morphology and cross-sectional TEM are examined in order to clarify the formation of these cracks. The cause of crack propagation through the film and into the substrate is identified as the underlying large anisotropic strain and relatively low stiffness of DSO substrates. The electrical conduction in the crack region is found to be several orders of magnitude higher than that in the uncracked areas of the film. The energy dispersive x-ray-verified La0.7Sr0.3MnO3 deposited into cracks may be responsible for the anomalous conducting behaviors. Finally, a simple model is constructed for estimating substrate fracture toughness and calculating an upper bound of film fracture toughness.

UR - http://www.scopus.com/inward/record.url?scp=84930226454&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84930226454&partnerID=8YFLogxK

U2 - 10.1063/1.4921522

DO - 10.1063/1.4921522

M3 - Article

AN - SCOPUS:84930226454

SN - 0003-6951

VL - 106

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 20

M1 - 201905

ER -

Anomalous crack arrays in anisotropic-strained manganite on scandate substrates

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this