Abstract
Process capability indices (PCIs) have been widely used in manufacturing industries. In this paper, we take a very specific view that a proper value of the process capacity index (PCI) represents the true yield of the process. Following this logic, a universal PCI, Cy, is proposed and derived. The superiority of the new PCI is presented in theory and demonstrated through examples.
Original language | English (US) |
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Pages (from-to) | 153-163 |
Number of pages | 11 |
Journal | Quality and Reliability Engineering International |
Volume | 22 |
Issue number | 2 |
DOIs | |
State | Published - Mar 1 2006 |
All Science Journal Classification (ASJC) codes
- Safety, Risk, Reliability and Quality
- Management Science and Operations Research