Another look at the process capability index

Min Te Chao, Dennis K.J. Lin

Research output: Contribution to journalArticlepeer-review

21 Scopus citations

Abstract

Process capability indices (PCIs) have been widely used in manufacturing industries. In this paper, we take a very specific view that a proper value of the process capacity index (PCI) represents the true yield of the process. Following this logic, a universal PCI, Cy, is proposed and derived. The superiority of the new PCI is presented in theory and demonstrated through examples.

Original languageEnglish (US)
Pages (from-to)153-163
Number of pages11
JournalQuality and Reliability Engineering International
Volume22
Issue number2
DOIs
StatePublished - Mar 1 2006

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Management Science and Operations Research

Fingerprint

Dive into the research topics of 'Another look at the process capability index'. Together they form a unique fingerprint.

Cite this