Another look at the process capability index

Min Te Chao, Dennis K.J. Lin

Research output: Contribution to journalArticlepeer-review

21 Scopus citations


Process capability indices (PCIs) have been widely used in manufacturing industries. In this paper, we take a very specific view that a proper value of the process capacity index (PCI) represents the true yield of the process. Following this logic, a universal PCI, Cy, is proposed and derived. The superiority of the new PCI is presented in theory and demonstrated through examples.

Original languageEnglish (US)
Pages (from-to)153-163
Number of pages11
JournalQuality and Reliability Engineering International
Issue number2
StatePublished - Mar 1 2006

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Management Science and Operations Research


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