Another look at the process capability index

Min Te Chao; Dennis K.J. Lin

doi:10.1002/qre.692

Another look at the process capability index

Min Te Chao
, Dennis K.J. Lin

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24 Scopus citations

Abstract

Process capability indices (PCIs) have been widely used in manufacturing industries. In this paper, we take a very specific view that a proper value of the process capacity index (PCI) represents the true yield of the process. Following this logic, a universal PCI, Cy, is proposed and derived. The superiority of the new PCI is presented in theory and demonstrated through examples.

Original language	English (US)
Pages (from-to)	153-163
Number of pages	11
Journal	Quality and Reliability Engineering International
Volume	22
Issue number	2
DOIs	https://doi.org/10.1002/qre.692
State	Published - Mar 1 2006

All Science Journal Classification (ASJC) codes

Safety, Risk, Reliability and Quality
Management Science and Operations Research

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10.1002/qre.692

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Another look at the process capability index

Abstract

All Science Journal Classification (ASJC) codes

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