Application of pan-sharpening to SIMS imaging

Jay Tarolli, Hua Tian, Nicholas Winograd

Research output: Contribution to journalArticlepeer-review

8 Scopus citations


Higher resolution and increased intensity is always a goal for SIMS imaging experiments. One approach to achieving this goal might be to utilize complementary data sources that could be merged through the process of image fusion. The idea to incorporate the best aspects of two different image acquisition approaches to maximize information content. Here, we examine a subset of image fusion, pan-sharpening, that is utilized to combine relevant and redundant information from a pair of high resolution and low resolution images to create a hybrid image. To test applicability to SIMS imaging, two different scenarios are considered. First, a copper-mesh grid SIMS image is fused with a higher resolution SEM image to improve the intensity and contrast between gridlines and background. Secondly, an SIMS image obtained with an Ar4000 + cluster primary ion beam is fused with a higher resolution C60 + image to map specific lipid signals in a 3D depth profile of HeLa cells.

Original languageEnglish (US)
Pages (from-to)217-220
Number of pages4
JournalSurface and Interface Analysis
Issue numberS1
StatePublished - Nov 1 2014

All Science Journal Classification (ASJC) codes

  • General Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry


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