Applications of capacitive array sensors to nondestructive evaluation

P. J. Shull; J. C. Moulder; P. R. Heyliger; M. Gimple; B. A. Auld

Applications of capacitive array sensors to nondestructive evaluation

P. J. Shull, J. C. Moulder, P. R. Heyliger, M. Gimple, B. A. Auld

Division of Business, Engineering, and Information Sciences & Technology (Altoona)

Research output: Chapter in Book/Report/Conference proceeding › Chapter

3 Scopus citations

Abstract

A capacitive array sensor was designed and fabricated for NDE applications and tested on both dielectrics and conductors. The response of the probe to steps and notches was characterized and the liftoff effect was studied. Buried flaws at depths greater than 4 mm were detected in dielectrics. In both insulators and conductors the probe was highly sensitive to surface features. Preliminary studies using the probe were also conducted in typical NDE applications including crack detection in glass, thickness and porosity monitoring in ceramics, and dielectric property determination during epoxy curing.

Original language	English (US)
Title of host publication	Review of Progress in Quantitative Nondestructive Evaluation
Pages	517-523
Number of pages	7
Volume	7 A
State	Published - Dec 1 1988

All Science Journal Classification (ASJC) codes

General Engineering

Cite this

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title = "Applications of capacitive array sensors to nondestructive evaluation",

abstract = "A capacitive array sensor was designed and fabricated for NDE applications and tested on both dielectrics and conductors. The response of the probe to steps and notches was characterized and the liftoff effect was studied. Buried flaws at depths greater than 4 mm were detected in dielectrics. In both insulators and conductors the probe was highly sensitive to surface features. Preliminary studies using the probe were also conducted in typical NDE applications including crack detection in glass, thickness and porosity monitoring in ceramics, and dielectric property determination during epoxy curing.",

author = "Shull, {P. J.} and Moulder, {J. C.} and Heyliger, {P. R.} and M. Gimple and Auld, {B. A.}",

year = "1988",

month = dec,

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volume = "7 A",

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T1 - Applications of capacitive array sensors to nondestructive evaluation

AU - Shull, P. J.

AU - Moulder, J. C.

AU - Heyliger, P. R.

AU - Gimple, M.

AU - Auld, B. A.

PY - 1988/12/1

Y1 - 1988/12/1

N2 - A capacitive array sensor was designed and fabricated for NDE applications and tested on both dielectrics and conductors. The response of the probe to steps and notches was characterized and the liftoff effect was studied. Buried flaws at depths greater than 4 mm were detected in dielectrics. In both insulators and conductors the probe was highly sensitive to surface features. Preliminary studies using the probe were also conducted in typical NDE applications including crack detection in glass, thickness and porosity monitoring in ceramics, and dielectric property determination during epoxy curing.

AB - A capacitive array sensor was designed and fabricated for NDE applications and tested on both dielectrics and conductors. The response of the probe to steps and notches was characterized and the liftoff effect was studied. Buried flaws at depths greater than 4 mm were detected in dielectrics. In both insulators and conductors the probe was highly sensitive to surface features. Preliminary studies using the probe were also conducted in typical NDE applications including crack detection in glass, thickness and porosity monitoring in ceramics, and dielectric property determination during epoxy curing.

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M3 - Chapter

AN - SCOPUS:0024129533

SN - 0306428377

VL - 7 A

SP - 517

EP - 523

BT - Review of Progress in Quantitative Nondestructive Evaluation

ER -

Applications of capacitive array sensors to nondestructive evaluation

Abstract

All Science Journal Classification (ASJC) codes

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