Applications of capacitive array sensors to nondestructive evaluation

P. J. Shull, J. C. Moulder, P. R. Heyliger, M. Gimple, B. A. Auld

Research output: Chapter in Book/Report/Conference proceedingChapter

3 Scopus citations


A capacitive array sensor was designed and fabricated for NDE applications and tested on both dielectrics and conductors. The response of the probe to steps and notches was characterized and the liftoff effect was studied. Buried flaws at depths greater than 4 mm were detected in dielectrics. In both insulators and conductors the probe was highly sensitive to surface features. Preliminary studies using the probe were also conducted in typical NDE applications including crack detection in glass, thickness and porosity monitoring in ceramics, and dielectric property determination during epoxy curing.

Original languageEnglish (US)
Title of host publicationReview of Progress in Quantitative Nondestructive Evaluation
Number of pages7
Volume7 A
StatePublished - Dec 1 1988

All Science Journal Classification (ASJC) codes

  • General Engineering


Dive into the research topics of 'Applications of capacitive array sensors to nondestructive evaluation'. Together they form a unique fingerprint.

Cite this