TY - GEN
T1 - Assessing carbon nanotube bundle interconnect for future FPGA architectures
AU - Eachempati, Soumya
AU - Nieuwoudt, Arthur
AU - Gayasen, Aman
AU - Vijaykrishnan, N.
AU - Massoud, Yehia
PY - 2007
Y1 - 2007
N2 - Field Programmable Gate Arrays (FPGAs) are important hardware platforms in various applications due to increasing design complexity and mask costs. However, as CMOS process technology continues to scale, standard copper interconnect will become a major bottleneck for FPGA performance. In this paper, we propose utilizing bundles of single-walled carbon nanotubes (SWCNT) as wires in the FPGA interconnect fabric and compare their performance to standard copper interconnect in future process technologies. To leverage the performance advantages of nanotube-based interconnect, we explore several important aspects of the FPGA routing architecture including the segmentation distribution and the internal population of the wires. The results demonstrate that FPGAs utilizing SWCNT bundle interconnect can achieve a 19% improvement in average area delay product over the best performing architecture for standard copper interconnect in 22 nm process technology.
AB - Field Programmable Gate Arrays (FPGAs) are important hardware platforms in various applications due to increasing design complexity and mask costs. However, as CMOS process technology continues to scale, standard copper interconnect will become a major bottleneck for FPGA performance. In this paper, we propose utilizing bundles of single-walled carbon nanotubes (SWCNT) as wires in the FPGA interconnect fabric and compare their performance to standard copper interconnect in future process technologies. To leverage the performance advantages of nanotube-based interconnect, we explore several important aspects of the FPGA routing architecture including the segmentation distribution and the internal population of the wires. The results demonstrate that FPGAs utilizing SWCNT bundle interconnect can achieve a 19% improvement in average area delay product over the best performing architecture for standard copper interconnect in 22 nm process technology.
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U2 - 10.1109/DATE.2007.364609
DO - 10.1109/DATE.2007.364609
M3 - Conference contribution
AN - SCOPUS:34548319188
SN - 3981080122
SN - 9783981080124
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 307
EP - 312
BT - Proceedings - 2007 Design, Automation and Test in Europe Conference and Exhibition, DATE 2007
T2 - 2007 Design, Automation and Test in Europe Conference and Exhibition
Y2 - 16 April 2007 through 20 April 2007
ER -