Astrophysical extended X-ray absorption fine-structure analysis

Jonathan W. Woo; Robert C. Forrey; Kyeongjae Cho

doi:10.1086/303711

Astrophysical extended X-ray absorption fine-structure analysis

Jonathan W. Woo, Robert C. Forrey, Kyeongjae Cho

Division of Science (Berks)

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

We present an astrophysical extended X-ray absorption fine-structure (EXAFS) analysis (AEA) tool. The AEA tool is designed to generate a numerical model of the modification to the X-ray absorption coefficient due to the EXAFS phenomenon. We have constructed a complete database (elements up to the atomic number 92) of EXAFS parameters: central atom phase shift (2δ₁), backscattering phase shift (φ_b), and backscattering amplitude (F). Using the EXAFS parameter data base, the AEA tool can generate a numerical model of any compound when the atomic numbers of neighboring atoms and their distances to the central X-ray-absorbing atom are given.

Original language	English (US)
Pages (from-to)	235-240
Number of pages	6
Journal	Astrophysical Journal
Volume	477
Issue number	1 PART I
DOIs	https://doi.org/10.1086/303711
State	Published - 1997

All Science Journal Classification (ASJC) codes

Astronomy and Astrophysics
Space and Planetary Science

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10.1086/303711

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title = "Astrophysical extended X-ray absorption fine-structure analysis",

abstract = "We present an astrophysical extended X-ray absorption fine-structure (EXAFS) analysis (AEA) tool. The AEA tool is designed to generate a numerical model of the modification to the X-ray absorption coefficient due to the EXAFS phenomenon. We have constructed a complete database (elements up to the atomic number 92) of EXAFS parameters: central atom phase shift (2δ1), backscattering phase shift (φb), and backscattering amplitude (F). Using the EXAFS parameter data base, the AEA tool can generate a numerical model of any compound when the atomic numbers of neighboring atoms and their distances to the central X-ray-absorbing atom are given.",

author = "Woo, {Jonathan W.} and Forrey, {Robert C.} and Kyeongjae Cho",

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doi = "10.1086/303711",

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T1 - Astrophysical extended X-ray absorption fine-structure analysis

AU - Woo, Jonathan W.

AU - Forrey, Robert C.

AU - Cho, Kyeongjae

PY - 1997

Y1 - 1997

N2 - We present an astrophysical extended X-ray absorption fine-structure (EXAFS) analysis (AEA) tool. The AEA tool is designed to generate a numerical model of the modification to the X-ray absorption coefficient due to the EXAFS phenomenon. We have constructed a complete database (elements up to the atomic number 92) of EXAFS parameters: central atom phase shift (2δ1), backscattering phase shift (φb), and backscattering amplitude (F). Using the EXAFS parameter data base, the AEA tool can generate a numerical model of any compound when the atomic numbers of neighboring atoms and their distances to the central X-ray-absorbing atom are given.

AB - We present an astrophysical extended X-ray absorption fine-structure (EXAFS) analysis (AEA) tool. The AEA tool is designed to generate a numerical model of the modification to the X-ray absorption coefficient due to the EXAFS phenomenon. We have constructed a complete database (elements up to the atomic number 92) of EXAFS parameters: central atom phase shift (2δ1), backscattering phase shift (φb), and backscattering amplitude (F). Using the EXAFS parameter data base, the AEA tool can generate a numerical model of any compound when the atomic numbers of neighboring atoms and their distances to the central X-ray-absorbing atom are given.

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DO - 10.1086/303711

M3 - Article

AN - SCOPUS:21744446214

SN - 0004-637X

VL - 477

SP - 235

EP - 240

JO - Astrophysical Journal

JF - Astrophysical Journal

IS - 1 PART I

ER -

Astrophysical extended X-ray absorption fine-structure analysis

Abstract

All Science Journal Classification (ASJC) codes

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