Atomic imaging in aberration-corrected HRTEM with application to Al alloys

J. H. Chen, K. Urban, B. Kabius, M. Lentzen, J. Jansen, H. W. Zandbergen

Research output: Contribution to journalArticlepeer-review

4 Scopus citations
Original languageEnglish (US)
Pages (from-to)468-469
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - 2002

All Science Journal Classification (ASJC) codes

  • Instrumentation

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