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Atomic imaging in aberration-corrected HRTEM with application to Al alloys

  • J. H. Chen
  • , K. Urban
  • , B. Kabius
  • , M. Lentzen
  • , J. Jansen
  • , H. W. Zandbergen

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)468-469
Number of pages2
JournalMicroscopy and Microanalysis
Volume8
Issue numberSUPPL. 2
DOIs
StatePublished - 2002

All Science Journal Classification (ASJC) codes

  • Instrumentation

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