Fingerprint
Dive into the research topics of 'Atomic scale defects in 4H SiC/SiO2 using electron spin resonance'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Atomic scale defects in 4H SiC/SiO2 using electron spin resonance
Aaron Rape, P. M. Lenahan, A. J. Lelis
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution