Abstract
The atomic structure of a carbon nanotube can be described by its chiral angle and diameter and can be specified by a pair of lattice indices (Formula presented) The electronic and mechanical properties are critically dependent on these indices. Scanning tunneling microscopy (STM) is a useful tool to investigate carbon nanotubes since the atomic structure as well as the electronic properties of individual molecules can be determined. This paper presents a discussion of the technique to obtain (Formula presented) indices of nanotubes from STM images in combination with current-voltage tunnel spectra. Image contrast, distortion effects, and determination of chiral angle and diameter are discussed. The procedure of (Formula presented) identification is demonstrated for a few single-walled carbon nanotubes.
Original language | English (US) |
---|---|
Pages (from-to) | 2991-2996 |
Number of pages | 6 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 61 |
Issue number | 4 |
DOIs | |
State | Published - 2000 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics