TY - JOUR
T1 - Atomically thin hexagonal boron nitride probed by ultrahigh-resolution transmission electron microscopy
AU - Alem, Nasim
AU - Erni, Rolf
AU - Kisielowski, Christian
AU - Rossell, Marta D.
AU - Gannett, Will
AU - Zettl, A.
PY - 2009/10/12
Y1 - 2009/10/12
N2 - We present a method to prepare monolayer and multilayer suspended sheets of hexagonal boron nitride (h-BN), using a combination of mechanical exfoliation and reactive ion etching. Ultrahigh-resolution transmission electron microscope imaging is employed to resolve the atoms, and intensity profiles for reconstructed phase images are used to identify the chemical nature (boron or nitrogen) of every atom throughout the sample. Reconstructed phase images are distinctly different for h-BN multilayers of even or odd number. Unusual triangular defects and zigzag and armchair edge reconstructions are uniquely identified and characterized.
AB - We present a method to prepare monolayer and multilayer suspended sheets of hexagonal boron nitride (h-BN), using a combination of mechanical exfoliation and reactive ion etching. Ultrahigh-resolution transmission electron microscope imaging is employed to resolve the atoms, and intensity profiles for reconstructed phase images are used to identify the chemical nature (boron or nitrogen) of every atom throughout the sample. Reconstructed phase images are distinctly different for h-BN multilayers of even or odd number. Unusual triangular defects and zigzag and armchair edge reconstructions are uniquely identified and characterized.
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U2 - 10.1103/PhysRevB.80.155425
DO - 10.1103/PhysRevB.80.155425
M3 - Article
AN - SCOPUS:72449128239
SN - 1098-0121
VL - 80
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 15
M1 - 155425
ER -