@inproceedings{18e8492b4001406cb8721eb22ce35f7e,
title = "Atomistic tight-binding based evaluation of impact of gate underlap on source to drain tunneling in 5 nm gate length Si FinFETs",
author = "Goud, {A. Arun} and Gupta, {Sumeet Kumar} and Choday, {Sri Harsha} and Kaushik Roy",
year = "2013",
doi = "10.1109/DRC.2013.6633788",
language = "English (US)",
isbn = "9781479908110",
series = "Device Research Conference - Conference Digest, DRC",
pages = "51--52",
booktitle = "71st Device Research Conference, DRC 2013 - Conference Digest",
note = "71st Device Research Conference, DRC 2013 ; Conference date: 23-06-2013 Through 26-06-2013",
}