TY - JOUR
T1 - Atoms, clusters and photons
T2 - Energetic probes for mass spectrometry
AU - Garrison, Barbara J.
N1 - Funding Information:
The authors acknowledges the National Science Foundation through the Chemistry Division and the Information Technology Research Program for financial support of this work. Helpful discussions with a number of people including but not limited to Nick Winograd, Zbigniew Postawa, John Vickerman, Leonid Zhigilei, Andreas Wucher, Igor Wojciechowski, Arnaud Delcorte, Mike Russo and Kate Ryan are gratefully acknowledged. The Academic Services and Emerging Technologies group at Penn State University assisted with computational efforts.
PY - 2006/7/30
Y1 - 2006/7/30
N2 - The physical mechanisms underlying the surface based mass spectrometry techniques of atomic SIMS, MALDI and cluster SIMS are discussed along with the relation of the physics to the measured quantities. In particular, there are at least two types of motion resulting from cluster bombardment in SIMS. One scenario involves the individual atoms in the cluster initiating collision cascades similar to atomic bombardment. The second mechanism involves a mesoscale motion of the cluster as a whole. This mesoscale motion can induce an organized flow of the ejected material in a plume.
AB - The physical mechanisms underlying the surface based mass spectrometry techniques of atomic SIMS, MALDI and cluster SIMS are discussed along with the relation of the physics to the measured quantities. In particular, there are at least two types of motion resulting from cluster bombardment in SIMS. One scenario involves the individual atoms in the cluster initiating collision cascades similar to atomic bombardment. The second mechanism involves a mesoscale motion of the cluster as a whole. This mesoscale motion can induce an organized flow of the ejected material in a plume.
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U2 - 10.1016/j.apsusc.2006.02.085
DO - 10.1016/j.apsusc.2006.02.085
M3 - Article
AN - SCOPUS:33747433799
SN - 0169-4332
VL - 252
SP - 6409
EP - 6412
JO - Applied Surface Science
JF - Applied Surface Science
IS - 19
ER -