Attenuated total reflectance infrared spectroscopy study of hysteresis of water and n -alcohol coadsorption on silicon oxide

Anna L. Barnette, Seong H. Kim

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11 Scopus citations


The structure and thickness of the binary adsorbate layers formed on silicon oxide exposed in n-propanol/water and n-pentanol/water vapor mixtures under atmospheric pressure and room temperature conditions were investigated using attenuated total reflectance infrared spectroscopy (ATR-IR). The ATR-IR spectra of the adsorbate layers were analyzed while the vapor composition was varied stepwise by changing the mixing ratios of (a) n-propanol vapor stream with a 94% relative partial pressure (P/Psat) and 94% P/P sat water stream and (b) 83% P/Psatn-pentanol and 85% P/Psat water streams. The amount of the adsorbed water with solid-like structure in the binary adsorbate layer was larger in successive cycles of the water/alcohol vapor composition change, while n-alcohol showed negligible hysteresis in the amount adsorbed. The hysteresis behavior of the solid-like water structure was amplified in the coadsorption cycles of alcohol and water as compared to the water-only case. The origin of this behavior must be attributed to the structure of the alcohol/water binary adsorbate layer. The n-alcohol molecules present at the adsorbate/vapor interface can lower the surface energy of the system and stabilize the solid-like water structure in the alcohol-water binary adsorbate layer on silicon oxide.

Original languageEnglish (US)
Pages (from-to)15529-15536
Number of pages8
Issue number44
StatePublished - Nov 6 2012

All Science Journal Classification (ASJC) codes

  • General Materials Science
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Spectroscopy
  • Electrochemistry


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