Augmenting astronomical X-ray detectors with AI for enhanced sensitivity and reduced background

D. R. Wilkins, A. Poliszczuk, B. Schneider, E. D. Miller, S. W. Allen, M. Bautz, T. Chattopadhyay, A. D. Falcone, R. Foster, C. E. Grant, S. Herrmann, R. Kraft, R. G. Morris, P. Nulsen, P. Orel, G. Schellenberger

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Bringing artificial intelligence (AI) alongside next-generation X-ray imaging detectors, including CCDs and DEPFET sensors, enhances their sensitivity to achieve many of the flagship science cases targeted by future X-ray observatories, based upon low surface brightness and high redshift sources. Machine learning algorithms operating on the raw frame-level data provide enhanced identification of background vs. astrophysical X-ray events, by considering all of the signals in the context within which they appear within each frame. We have developed prototype machine learning algorithms to identify valid X-ray and cosmic-ray induced background events, trained and tested upon a suite of realistic end-to-end simulations that trace the interaction of cosmic ray particles and their secondaries through the spacecraft and detector. These algorithms demonstrate that AI can reduce the unrejected instrumental background by up to 41.5 per cent compared with traditional filtering methods. Alongside AI algorithms to reduce the instrumental background, next-generation event reconstruction methods, based upon fitting physically-motivated Gaussian models of the charge clouds produced by events within the detector, promise increased accuracy and spectral resolution of the lowest energy photon events.

Original languageEnglish (US)
Title of host publicationSpace Telescopes and Instrumentation 2024
Subtitle of host publicationUltraviolet to Gamma Ray
EditorsJan-Willem A. den Herder, Shouleh Nikzad, Kazuhiro Nakazawa
PublisherSPIE
ISBN (Electronic)9781510675094
DOIs
StatePublished - 2024
EventSpace Telescopes and Instrumentation 2024: Ultraviolet to Gamma Ray - Yokohama, Japan
Duration: Jun 16 2024Jun 21 2024

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13093
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceSpace Telescopes and Instrumentation 2024: Ultraviolet to Gamma Ray
Country/TerritoryJapan
CityYokohama
Period6/16/246/21/24

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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