TY - GEN
T1 - Automated Electro-Thermal Modeling Framework of Distributed Vertical Power Delivery Architectures with Substrate-Embedded Microfluidic Cooling
AU - Choi, Mingeun
AU - Krishnakumar, Sriharini
AU - Popryho, Yaroslav
AU - Khorasani, Ramin Rahimzadeh
AU - Swaminathan, Madhavan
AU - Partin-Vaisband, Inna
AU - Kumar, Satish
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - Next-generation high-performance computing (HPC) systems require power delivery solutions capable of sustaining beyond 1 kW per monolithic chip, with current densities expected to reach or exceed 2A/mm2. Distributed vertical power delivery (DVPD) architectures with integrated voltage regulators (IVRs) address this challenge by placing conversion stages closer to the processor, thereby reducing conduction losses. However, the interplay between temperature-dependent power dissipation and substrateembedded microfluidic cooling-particularly in 3D-stacked configurations where inner tiers have limited heat dissipation pathways-has been underexplored. This paper presents a PyAEDT-driven, automated electro-thermal modeling framework for 48 -to- 1 V DVPD architectures to accurately capture realistic power losses and pumping demands. Results demonstrate that ignoring electro-thermal feedback leads to significant underestimation of both power loss and IVR area. An electrical-only analysis predicts a total converter loss of 251.86 W, whereas integrating thermal effects raises this value to 285.91 W -an increase of about 13.5%. Likewise, IVR sizing grows by approximately 11% to mitigate elevated on-resistance and switching losses at higher temperatures. To maintain hot-spot temperatures below 85°C, the required microfluidic flow rate must rise from 1g/s, which is needed without considering electro-thermal interactions, to 2.47g/s, generating a pressure drop of 47.9 kPa. Despite this higher flow rate, the pumping overhead remains only 122.32 mW, which is negligible compared to the extensive conduction and switching losses that would occur in inadequately cooled systems.
AB - Next-generation high-performance computing (HPC) systems require power delivery solutions capable of sustaining beyond 1 kW per monolithic chip, with current densities expected to reach or exceed 2A/mm2. Distributed vertical power delivery (DVPD) architectures with integrated voltage regulators (IVRs) address this challenge by placing conversion stages closer to the processor, thereby reducing conduction losses. However, the interplay between temperature-dependent power dissipation and substrateembedded microfluidic cooling-particularly in 3D-stacked configurations where inner tiers have limited heat dissipation pathways-has been underexplored. This paper presents a PyAEDT-driven, automated electro-thermal modeling framework for 48 -to- 1 V DVPD architectures to accurately capture realistic power losses and pumping demands. Results demonstrate that ignoring electro-thermal feedback leads to significant underestimation of both power loss and IVR area. An electrical-only analysis predicts a total converter loss of 251.86 W, whereas integrating thermal effects raises this value to 285.91 W -an increase of about 13.5%. Likewise, IVR sizing grows by approximately 11% to mitigate elevated on-resistance and switching losses at higher temperatures. To maintain hot-spot temperatures below 85°C, the required microfluidic flow rate must rise from 1g/s, which is needed without considering electro-thermal interactions, to 2.47g/s, generating a pressure drop of 47.9 kPa. Despite this higher flow rate, the pumping overhead remains only 122.32 mW, which is negligible compared to the extensive conduction and switching losses that would occur in inadequately cooled systems.
UR - https://www.scopus.com/pages/publications/105029514689
UR - https://www.scopus.com/pages/publications/105029514689#tab=citedBy
U2 - 10.1109/ITherm55376.2025.11235621
DO - 10.1109/ITherm55376.2025.11235621
M3 - Conference contribution
AN - SCOPUS:105029514689
T3 - InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, ITHERM
BT - Proceedings of the 24th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, ITherm 2025
PB - IEEE Computer Society
T2 - 24th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, ITherm 2025
Y2 - 27 May 2025 through 30 May 2025
ER -