Automated Generation of All-Digital 1/0 Library Cells for System-In-Package Integration of Multiple Dies

M. Lee, A. Singh, H. M. Torun, J. Kim, S. Lim, M. Swaminathan, S. Mukhopadhyay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

This paper presents an automated cell library generation flow for all-digital I/O circuits for SiP integration. Given parameterized models of SiP wire traces, our method automatically designs, optimizes, and generates layouts of I/O cells for delay/energy minimization. We demonstrate that automated I/O library cell generation can reduce maximum die-to-die communication delay or energy for a given multi-die SiP design and associated interposer wire traces. The proposed flow is demonstrated considering 28nm CMOS technology and interposer based SiP integration.

Original languageEnglish (US)
Title of host publicationEPEPS 2018 - IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages65-67
Number of pages3
ISBN (Electronic)9781538693032
DOIs
StatePublished - Nov 13 2018
Event27th IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2018 - San Jose, United States
Duration: Oct 14 2018Oct 17 2018

Publication series

NameEPEPS 2018 - IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems

Conference

Conference27th IEEE Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2018
Country/TerritoryUnited States
CitySan Jose
Period10/14/1810/17/18

All Science Journal Classification (ASJC) codes

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Electronic, Optical and Magnetic Materials

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