Abstract
Most pathologies (tumor, bleed, stroke) of the human brain can be determined by a symmetry-based analysis of neural scans showing the brain's 3D internal structure. Detecting departures of this internal structure from its normal bilateral symmetry can guide the classification of abnormalities. This process is facilitated by first locating the ideal symmetry plane (midsagittal) with respect to which the brain is invariant under reflection. An algorithm to automatically identify this bilateral symmetry plane from a given 3D clinical image has been developed. The method has been tested on both normal and pathological brain scans, multimodal data (CT and MR), and on coarsely sliced samples with elongated voxel sizes.
Original language | English (US) |
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Pages (from-to) | 1528-1539 |
Number of pages | 12 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 3338 |
DOIs | |
State | Published - 1998 |
Event | Medical Imaging 1998: Image Processing - San Diego, CA, United States Duration: Feb 23 1998 → Feb 23 1998 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering