Abstract
Summary & Conclusions - This paper estimates component reliability from masked series-system life data, viz, data where the exact component causing system failure might be unknown. It focuses on a Bayes approach which considers prior information on the component reliabilities. In most practical settings, prior engineering knowledge on component reliabilities is extensive. Engineers routinely use prior knowledge and judgment in a variety of ways. The Bayes methodology proposed here provides a formal, realistic means of incorporating such subjective knowledge into the estimation process. In the event that little prior knowledge is available, conservative or even non-informative priors, can be selected. The model is illustrated for a 2-component series system of exponential components. In particular it uses discrete-step priors because of their ease of development & interpretation. By taking advantage of the prior information, the Bayes point-estimates consistently perform well, ie, are close to the MLE. While the approach is computationally intensive, the calculations can be easily computerized.
Original language | English (US) |
---|---|
Pages (from-to) | 233-237 |
Number of pages | 5 |
Journal | IEEE Transactions on Reliability |
Volume | 45 |
Issue number | 2 |
DOIs | |
State | Published - 1996 |
All Science Journal Classification (ASJC) codes
- Safety, Risk, Reliability and Quality
- Electrical and Electronic Engineering