Abstract
Computing risk-based misclassification error density distribution for ensembles is an important yet difficult task. Bayesian methods provide one way to estimate these density distributions. In this paper, Bayesian modeling approach is used to compute posterior misclassification error density distributions for both binary and non-binary classifiers. Real-world datasets and holdout samples are used to illustrate computation of posterior misclassification error distributions. These posterior error distributions are very useful to compare ensembles, and provide risk-based misclassification cost estimates.
Original language | English (US) |
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Pages (from-to) | 484-492 |
Number of pages | 9 |
Journal | Engineering Applications of Artificial Intelligence |
Volume | 65 |
DOIs | |
State | Published - Oct 2017 |
All Science Journal Classification (ASJC) codes
- Control and Systems Engineering
- Artificial Intelligence
- Electrical and Electronic Engineering