Bias-enhanced visible-rejection of GaN Schottky barrier ultraviolet photodetectors

Zhenyu Jiang, Wenjun Zhang, Andy Luo, Mahmoud R.M. Atalla, Guanjun You, Xiaoyun Li, Li Wang, Jie Liu, Asim M. Elahi, Lai Wei, Yu Zhang, Jian Xu

Research output: Contribution to journalArticlepeer-review

13 Scopus citations


The bias-enhanced performance of visible-blind ultraviolet (UV) detection of GaN Schottky barrier diodes has been studied. The UV response of the Schottky diodes was found to be vastly amplified at elevated reverse bias, leading to the observation of the voltage-dependent gain arising from the defect-induced Schottky barrier lowering effect. In contrast, the visible light response of the GaN Schottky diodes shows insignificant voltage dependence because of the dominance of the internal photoemission absorption. Thus, the visible rejection ratio, defined as the responsivity of UV over visible range, can be greatly enhanced at high operating bias for the UV detectors based on the GaN Schottky barrier diodes. The observation has been supported by both experimental results and simulation data, and has been utilized to minimize the interference between the monolithically integrated GaN photodetectors and power light-emitting diodes (LEDs) in the present study of LED communication.

Original languageEnglish (US)
Article number7031927
Pages (from-to)994-997
Number of pages4
JournalIEEE Photonics Technology Letters
Issue number9
StatePublished - May 1 2015

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering


Dive into the research topics of 'Bias-enhanced visible-rejection of GaN Schottky barrier ultraviolet photodetectors'. Together they form a unique fingerprint.

Cite this