Blue phosphorescent organic light emitting device stability analysis

Brian W. D'Andrade; Michael S. Weaver; Peter B. Mackenzie; Hitoshi Yamamoto; Julie J. Brown; Noel C. Giebink; Stephen R. Forrest; Mark E. Thompson

doi:10.1889/1.3069766

Blue phosphorescent organic light emitting device stability analysis

Brian W. D'Andrade
, Michael S. Weaver
, Peter B. Mackenzie
, Hitoshi Yamamoto
, Julie J. Brown
, Noel C. Giebink
, Stephen R. Forrest
, Mark E. Thompson

Electrical Engineering

Research output: Contribution to journal › Conference article › peer-review

7 Scopus citations

Abstract

A model based on defect generation by exciton-polaron annihilation interactions between the emitter and host molecules, in a blue phosphorescent OLED, is shown to fit well with experimental data. A blue PHOLED with (0.15, 0.25) chromaticity is shown to have a halflife, from 1,000 nits, of 690 hrs.

Original language	English (US)
Pages (from-to)	712-715
Number of pages	4
Journal	Digest of Technical Papers - SID International Symposium
Volume	39
Issue number	1
DOIs	https://doi.org/10.1889/1.3069766
State	Published - 2008
Event	2008 SID International Symposium - Los Angeles, CA, United States Duration: May 20 2008 → May 21 2008

All Science Journal Classification (ASJC) codes

General Engineering

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10.1889/1.3069766

Cite this

@article{1d681ba9e982404aa4dd2a0aa7e68f69,

title = "Blue phosphorescent organic light emitting device stability analysis",

abstract = "A model based on defect generation by exciton-polaron annihilation interactions between the emitter and host molecules, in a blue phosphorescent OLED, is shown to fit well with experimental data. A blue PHOLED with (0.15, 0.25) chromaticity is shown to have a halflife, from 1,000 nits, of 690 hrs.",

author = "D'Andrade, \{Brian W.\} and Weaver, \{Michael S.\} and Mackenzie, \{Peter B.\} and Hitoshi Yamamoto and Brown, \{Julie J.\} and Giebink, \{Noel C.\} and Forrest, \{Stephen R.\} and Thompson, \{Mark E.\}",

year = "2008",

doi = "10.1889/1.3069766",

language = "English (US)",

volume = "39",

pages = "712--715",

journal = "Digest of Technical Papers - SID International Symposium",

issn = "0097-966X",

publisher = "John Wiley and Sons Inc.",

number = "1",

note = "2008 SID International Symposium ; Conference date: 20-05-2008 Through 21-05-2008",

}

TY - JOUR

T1 - Blue phosphorescent organic light emitting device stability analysis

AU - D'Andrade, Brian W.

AU - Weaver, Michael S.

AU - Mackenzie, Peter B.

AU - Yamamoto, Hitoshi

AU - Brown, Julie J.

AU - Giebink, Noel C.

AU - Forrest, Stephen R.

AU - Thompson, Mark E.

PY - 2008

Y1 - 2008

N2 - A model based on defect generation by exciton-polaron annihilation interactions between the emitter and host molecules, in a blue phosphorescent OLED, is shown to fit well with experimental data. A blue PHOLED with (0.15, 0.25) chromaticity is shown to have a halflife, from 1,000 nits, of 690 hrs.

AB - A model based on defect generation by exciton-polaron annihilation interactions between the emitter and host molecules, in a blue phosphorescent OLED, is shown to fit well with experimental data. A blue PHOLED with (0.15, 0.25) chromaticity is shown to have a halflife, from 1,000 nits, of 690 hrs.

UR - https://www.scopus.com/pages/publications/54549106730

UR - https://www.scopus.com/pages/publications/54549106730#tab=citedBy

U2 - 10.1889/1.3069766

DO - 10.1889/1.3069766

M3 - Conference article

AN - SCOPUS:54549106730

SN - 0097-966X

VL - 39

SP - 712

EP - 715

JO - Digest of Technical Papers - SID International Symposium

JF - Digest of Technical Papers - SID International Symposium

IS - 1

T2 - 2008 SID International Symposium

Y2 - 20 May 2008 through 21 May 2008

ER -

Blue phosphorescent organic light emitting device stability analysis

Abstract

All Science Journal Classification (ASJC) codes

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