Broadband Dielectric Characterization of Glasses and Other Silicates up to the THz Frequencies

Rocio Rodriguez-Canov, Michael Lanagan, Steven Perini, Xiaojiang Li, Venkatraman Gopalan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The dielectric characterization of silicate materials up to 2.5 THz is presented in this paper, to try to fill up the THz gap between electrical and optical measurements. Several measurement techniques have been employed to provide a broadband response. Materials in the silicate family can be classified as amorphous or crystalline. The internal structure, as well as the composition of the material, influences the dielectric properties. The loss of a material depends on its crystallinity, with higher crystallinity exhibiting lower loss.

Original languageEnglish (US)
Title of host publication2023 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, AP-S/URSI 2023 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages287-288
Number of pages2
ISBN (Electronic)9781665442282
DOIs
StatePublished - 2023
Event2023 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, AP-S/URSI 2023 - Portland, United States
Duration: Jul 23 2023Jul 28 2023

Publication series

NameIEEE Antennas and Propagation Society, AP-S International Symposium (Digest)
Volume2023-July
ISSN (Print)1522-3965

Conference

Conference2023 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, AP-S/URSI 2023
Country/TerritoryUnited States
CityPortland
Period7/23/237/28/23

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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