CAD models for estimating the capacitance of a microstrip interconnect: Comparison and improvisation

S. R. Nelatury, M. N.O. Sadiku, V. K. Devabhaktuni

Research output: Chapter in Book/Report/Conference proceedingConference contribution

19 Scopus citations

Abstract

Although the field of numerical electromagnetics (EM) has come to a relatively high level of maturity, RF/microwave engineers seem to prefer simple yet accurate closed-form expressions for design parameters of interest. For instance, a common practice is to use empirical formulae for the estimation of capacitance per unit length of microstrip interconnects. Literature survey reveals that several formulae have been proposed in the past 40 years or so. Each of these works involves the building of a CAD model (or formulae) based on certain assumptions. It is these assumptions that differentiate one work from another (e.g., in terms of model accuracy valid frequency range etc). Comparison of these formulae against measurements indicates, to an RF/microwave engineer, which of these formulae best-suits a given CAD scenario. In this paper we compare 12 such formulae, all of which estimate the same quantity, i.e., capacitance. Cross- fertilization of certain intermediate steps of the above works could potentially lead to composite models that offer relatively better accuracies. The work is of practical relevance to RF/microwave designers.

Original languageEnglish (US)
Title of host publicationProgress in Electromagnetics Research Symposium 2007, PIERS 2007 Prague
PublisherElectromagnetics Academy
Pages18-23
Number of pages6
ISBN (Print)9781618390523
StatePublished - 2007
EventProgress in Electromagnetics Research Symposium 2007, PIERS 2007 Prague - Prague, Czech Republic
Duration: Aug 27 2007Aug 30 2007

Publication series

NameProgress in Electromagnetics Research Symposium
ISSN (Print)1559-9450

Other

OtherProgress in Electromagnetics Research Symposium 2007, PIERS 2007 Prague
Country/TerritoryCzech Republic
CityPrague
Period8/27/078/30/07

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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