Abstract
An approach is presented for the determination of the residual stresses and elastic moduli of particle systems resulting from computer simulations of particle or atomic deposition. The proposed technique is based on fundamental concepts of elasticity and is capable of capturing the variation of stresses and moduli as functions of position within the system. Application to a simple particle system consisting of a deposited thin film is demonstrated.
Original language | English (US) |
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Pages (from-to) | Z10.3.1-Z10.3.6 |
Journal | Materials Research Society Symposium - Proceedings |
Volume | 653 |
State | Published - 2001 |
Event | Multiscale Modeling of Materials-2000 - Boston, MA, United States Duration: Nov 27 2000 → Dec 1 2000 |
All Science Journal Classification (ASJC) codes
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering