Calibration of near field measurements using microstrip line for noise predictions

Krishna Srinivasan, Hideki Sasaki, Madhavan Swaminathan, Rao Tummala

Research output: Contribution to journalConference articlepeer-review

4 Scopus citations


In this paper, near-field measurements from a microstrip line, obtained using an NEC probe, are presented for frequencies over a wide bandwidth from 250MHz to 3GHz. Near-field measurements obtained using the NEC probe are in good agreement with HFSS simulation results and analytical models. It has been shown through experimental near-field measurements and numerical simulations that the return current on the ground plane of a microstrip line, although small in areas on the ground plane away from the signal line, produces significant magnetic field. Circuits placed above the area where the magnetic field strength is large will experience strong electromagnetic interference. Near-field measurements help with placement of circuits to realize systems with minimal electromagnetic coupling. This research work will lead to the development of design guidelines for reducing the effect of EMI in microelectronic systems.

Original languageEnglish (US)
Pages (from-to)1432-1436
Number of pages5
JournalProceedings - Electronic Components and Technology Conference
StatePublished - 2004
Event2004 Proceedings - 54th Electronic Components and Technology Conference - Las Vegas, NV, United States
Duration: Jun 1 2004Jun 4 2004

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering


Dive into the research topics of 'Calibration of near field measurements using microstrip line for noise predictions'. Together they form a unique fingerprint.

Cite this