Calibration results for the AXAF flight contamination monitor

R. F. Elsner; S. L. O'Dell; B. D. Ramsey; A. F. Tennant; M. C. Weisskopf; J. J. Kolodziejczak; D. A. Swartz; D. E. Engelhaupt; G. P. Garmire; J. A. Nousek; M. W. Bautz; T. J. Gaetz; P. Zhao

doi:10.1117/12.331235

Calibration results for the AXAF flight contamination monitor

R. F. Elsner, S. L. O'Dell, B. D. Ramsey, A. F. Tennant, M. C. Weisskopf, J. J. Kolodziejczak, D. A. Swartz, D. E. Engelhaupt, G. P. Garmire, J. A. Nousek, M. W. Bautz, T. J. Gaetz, P. Zhao

Astronomy & Astrophysics

Research output: Contribution to journal › Conference article › peer-review

7 Scopus citations

Abstract

The Advanced X-ray Astrophysics Facility (AXAF) ground calibration program, easily the most extensive in the history of high energy astrophysics, requires careful attention to the verification of its validity for on-orbit operations of the observatory. The purpose of the Flight Contamination Monitor (FCM) is to verify the transfer of the AXAF absolute flux scale calibration from ground to on-orbit operations and to measure or bound any changes in molecular contamination on the AXAF mirrors. This paper reports the current status of the analysis of FCM measurements taken during ground calibration. The FCM measurements during the AXAF activation phase will be the first look at the on-orbit AXAF performance.

Original language	English (US)
Pages (from-to)	177-188
Number of pages	12
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3444
DOIs	https://doi.org/10.1117/12.331235
State	Published - 1998
Event	Proceedings of the 1998 Conference on X-Ray Optics, Instruments, and Missions - San Diego, CA, USA Duration: Jul 19 1998 → Jul 22 1998

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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Elsner, R. F., O'Dell, S. L., Ramsey, B. D., Tennant, A. F., Weisskopf, M. C., Kolodziejczak, J. J., Swartz, D. A., Engelhaupt, D. E., Garmire, G. P., Nousek, J. A., Bautz, M. W., Gaetz, T. J., & Zhao, P. (1998). Calibration results for the AXAF flight contamination monitor. Proceedings of SPIE - The International Society for Optical Engineering, 3444, 177-188. https://doi.org/10.1117/12.331235

@article{ae1eccfad61f4aad9ee962474b658ed6,

title = "Calibration results for the AXAF flight contamination monitor",

abstract = "The Advanced X-ray Astrophysics Facility (AXAF) ground calibration program, easily the most extensive in the history of high energy astrophysics, requires careful attention to the verification of its validity for on-orbit operations of the observatory. The purpose of the Flight Contamination Monitor (FCM) is to verify the transfer of the AXAF absolute flux scale calibration from ground to on-orbit operations and to measure or bound any changes in molecular contamination on the AXAF mirrors. This paper reports the current status of the analysis of FCM measurements taken during ground calibration. The FCM measurements during the AXAF activation phase will be the first look at the on-orbit AXAF performance.",

author = "Elsner, {R. F.} and O'Dell, {S. L.} and Ramsey, {B. D.} and Tennant, {A. F.} and Weisskopf, {M. C.} and Kolodziejczak, {J. J.} and Swartz, {D. A.} and Engelhaupt, {D. E.} and Garmire, {G. P.} and Nousek, {J. A.} and Bautz, {M. W.} and Gaetz, {T. J.} and P. Zhao",

year = "1998",

doi = "10.1117/12.331235",

language = "English (US)",

volume = "3444",

pages = "177--188",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Proceedings of the 1998 Conference on X-Ray Optics, Instruments, and Missions ; Conference date: 19-07-1998 Through 22-07-1998",

}

TY - JOUR

T1 - Calibration results for the AXAF flight contamination monitor

AU - Elsner, R. F.

AU - O'Dell, S. L.

AU - Ramsey, B. D.

AU - Tennant, A. F.

AU - Weisskopf, M. C.

AU - Kolodziejczak, J. J.

AU - Swartz, D. A.

AU - Engelhaupt, D. E.

AU - Garmire, G. P.

AU - Nousek, J. A.

AU - Bautz, M. W.

AU - Gaetz, T. J.

AU - Zhao, P.

PY - 1998

Y1 - 1998

N2 - The Advanced X-ray Astrophysics Facility (AXAF) ground calibration program, easily the most extensive in the history of high energy astrophysics, requires careful attention to the verification of its validity for on-orbit operations of the observatory. The purpose of the Flight Contamination Monitor (FCM) is to verify the transfer of the AXAF absolute flux scale calibration from ground to on-orbit operations and to measure or bound any changes in molecular contamination on the AXAF mirrors. This paper reports the current status of the analysis of FCM measurements taken during ground calibration. The FCM measurements during the AXAF activation phase will be the first look at the on-orbit AXAF performance.

AB - The Advanced X-ray Astrophysics Facility (AXAF) ground calibration program, easily the most extensive in the history of high energy astrophysics, requires careful attention to the verification of its validity for on-orbit operations of the observatory. The purpose of the Flight Contamination Monitor (FCM) is to verify the transfer of the AXAF absolute flux scale calibration from ground to on-orbit operations and to measure or bound any changes in molecular contamination on the AXAF mirrors. This paper reports the current status of the analysis of FCM measurements taken during ground calibration. The FCM measurements during the AXAF activation phase will be the first look at the on-orbit AXAF performance.

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U2 - 10.1117/12.331235

DO - 10.1117/12.331235

M3 - Conference article

AN - SCOPUS:0032291135

SN - 0277-786X

VL - 3444

SP - 177

EP - 188

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Proceedings of the 1998 Conference on X-Ray Optics, Instruments, and Missions

Y2 - 19 July 1998 through 22 July 1998

ER -

Calibration results for the AXAF flight contamination monitor

Abstract

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