Calibration results for the AXAF flight contamination monitor

R. F. Elsner, S. L. O'Dell, B. D. Ramsey, A. F. Tennant, M. C. Weisskopf, J. J. Kolodziejczak, D. A. Swartz, D. E. Engelhaupt, G. P. Garmire, J. A. Nousek, M. W. Bautz, T. J. Gaetz, P. Zhao

Research output: Contribution to journalConference articlepeer-review

7 Scopus citations


The Advanced X-ray Astrophysics Facility (AXAF) ground calibration program, easily the most extensive in the history of high energy astrophysics, requires careful attention to the verification of its validity for on-orbit operations of the observatory. The purpose of the Flight Contamination Monitor (FCM) is to verify the transfer of the AXAF absolute flux scale calibration from ground to on-orbit operations and to measure or bound any changes in molecular contamination on the AXAF mirrors. This paper reports the current status of the analysis of FCM measurements taken during ground calibration. The FCM measurements during the AXAF activation phase will be the first look at the on-orbit AXAF performance.

Original languageEnglish (US)
Pages (from-to)177-188
Number of pages12
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - 1998
EventProceedings of the 1998 Conference on X-Ray Optics, Instruments, and Missions - San Diego, CA, USA
Duration: Jul 19 1998Jul 22 1998

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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