Calibration results for the AXAF flight contamination monitor

R. F. Elsner, S. L. O'Dell, B. D. Ramsey, A. F. Tennant, M. C. Weisskopf, J. J. Kolodziejczak, D. A. Swartz, D. E. Engelhaupt, G. P. Garmire, J. A. Nousek, M. W. Bautz, T. J. Gaetz, P. Zhao

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Physics