Causal modeling and extraction of dielectric constant and loss tangent for thin dielectrics

A. Ege Engin; Abdemanaf Tambawala; Madhavan Swaminathan; Swapan Bhattacharya; Pranabes Pramanik; Kazuhiro Yamazaki

doi:10.1109/ISEMC.2007.55

Causal modeling and extraction of dielectric constant and loss tangent for thin dielectrics

A. Ege Engin, Abdemanaf Tambawala, Madhavan Swaminathan, Swapan Bhattacharya, Pranabes Pramanik, Kazuhiro Yamazaki

Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

7 Scopus citations

Abstract

New dielectric materials are being used for reducing electromagnetic interference (EMI) and improving signal integrity (SI). Examples include using high dielectric constant materials for decoupling and thin dielectrics for managing return currents. As the frequency of the signals being propagated through such materials increases, the frequency dependent material properties become very important. We present a method to extract the frequency-dependent dielectric constant and loss tangent of such materials using rectangular power/ground planes. We have also developed a rapid plane solver for fast extraction of material properties and a causal modeling methodology based on the vector fitting algorithm.

Original language	English (US)
Title of host publication	IEEE International Symposium on Electromagnetic Compatibility, EMC 2007
DOIs	https://doi.org/10.1109/ISEMC.2007.55
State	Published - 2007
Event	IEEE International Symposium on Electromagnetic Compatibility, EMC 2007 - Honolulu, HI, United States Duration: Jul 9 2007 → Jul 13 2007

Publication series

Name	IEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)	1077-4076

Conference

Conference	IEEE International Symposium on Electromagnetic Compatibility, EMC 2007
Country/Territory	United States
City	Honolulu, HI
Period	7/9/07 → 7/13/07

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/ISEMC.2007.55

Cite this

Engin, A. E., Tambawala, A., Swaminathan, M., Bhattacharya, S., Pramanik, P., & Yamazaki, K. (2007). Causal modeling and extraction of dielectric constant and loss tangent for thin dielectrics. In IEEE International Symposium on Electromagnetic Compatibility, EMC 2007 Article 4305635 (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2007.55

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title = "Causal modeling and extraction of dielectric constant and loss tangent for thin dielectrics",

abstract = "New dielectric materials are being used for reducing electromagnetic interference (EMI) and improving signal integrity (SI). Examples include using high dielectric constant materials for decoupling and thin dielectrics for managing return currents. As the frequency of the signals being propagated through such materials increases, the frequency dependent material properties become very important. We present a method to extract the frequency-dependent dielectric constant and loss tangent of such materials using rectangular power/ground planes. We have also developed a rapid plane solver for fast extraction of material properties and a causal modeling methodology based on the vector fitting algorithm.",

author = "Engin, {A. Ege} and Abdemanaf Tambawala and Madhavan Swaminathan and Swapan Bhattacharya and Pranabes Pramanik and Kazuhiro Yamazaki",

year = "2007",

doi = "10.1109/ISEMC.2007.55",

language = "English (US)",

isbn = "1424413508",

series = "IEEE International Symposium on Electromagnetic Compatibility",

booktitle = "IEEE International Symposium on Electromagnetic Compatibility, EMC 2007",

note = "IEEE International Symposium on Electromagnetic Compatibility, EMC 2007 ; Conference date: 09-07-2007 Through 13-07-2007",

}

Engin, AE, Tambawala, A, Swaminathan, M, Bhattacharya, S, Pramanik, P & Yamazaki, K 2007, Causal modeling and extraction of dielectric constant and loss tangent for thin dielectrics. in IEEE International Symposium on Electromagnetic Compatibility, EMC 2007., 4305635, IEEE International Symposium on Electromagnetic Compatibility, IEEE International Symposium on Electromagnetic Compatibility, EMC 2007, Honolulu, HI, United States, 7/9/07. https://doi.org/10.1109/ISEMC.2007.55

Causal modeling and extraction of dielectric constant and loss tangent for thin dielectrics. / Engin, A. Ege; Tambawala, Abdemanaf; Swaminathan, Madhavan et al.
IEEE International Symposium on Electromagnetic Compatibility, EMC 2007. 2007. 4305635 (IEEE International Symposium on Electromagnetic Compatibility).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Causal modeling and extraction of dielectric constant and loss tangent for thin dielectrics

AU - Engin, A. Ege

AU - Tambawala, Abdemanaf

AU - Swaminathan, Madhavan

AU - Bhattacharya, Swapan

AU - Pramanik, Pranabes

AU - Yamazaki, Kazuhiro

PY - 2007

Y1 - 2007

N2 - New dielectric materials are being used for reducing electromagnetic interference (EMI) and improving signal integrity (SI). Examples include using high dielectric constant materials for decoupling and thin dielectrics for managing return currents. As the frequency of the signals being propagated through such materials increases, the frequency dependent material properties become very important. We present a method to extract the frequency-dependent dielectric constant and loss tangent of such materials using rectangular power/ground planes. We have also developed a rapid plane solver for fast extraction of material properties and a causal modeling methodology based on the vector fitting algorithm.

AB - New dielectric materials are being used for reducing electromagnetic interference (EMI) and improving signal integrity (SI). Examples include using high dielectric constant materials for decoupling and thin dielectrics for managing return currents. As the frequency of the signals being propagated through such materials increases, the frequency dependent material properties become very important. We present a method to extract the frequency-dependent dielectric constant and loss tangent of such materials using rectangular power/ground planes. We have also developed a rapid plane solver for fast extraction of material properties and a causal modeling methodology based on the vector fitting algorithm.

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DO - 10.1109/ISEMC.2007.55

M3 - Conference contribution

AN - SCOPUS:47749151125

SN - 1424413508

SN - 9781424413508

T3 - IEEE International Symposium on Electromagnetic Compatibility

BT - IEEE International Symposium on Electromagnetic Compatibility, EMC 2007

T2 - IEEE International Symposium on Electromagnetic Compatibility, EMC 2007

Y2 - 9 July 2007 through 13 July 2007

ER -

Causal modeling and extraction of dielectric constant and loss tangent for thin dielectrics

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