CH027

Y. Han; I. M. Reaney; R. Johnson; M. B. Telli; D. S. Tinberg; I. Levin; S. Trolier-McKinstry

doi:10.1109/ISAF.2008.4693931

CH027

Y. Han, I. M. Reaney, R. Johnson, M. B. Telli, D. S. Tinberg, I. Levin, S. Trolier-McKinstry

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Epitaxial AgTa_0.5Nb_0.5O₃ (ATN) films deposited on (001)_p SrRuO₃/LaAlO₃ and LaAlO₃ by a chemical solution deposition technique have been characterised by transmission electron microscopy. The structure of the ATN layers has been compared with equivalent bulk ceramics. For thin ATN films, only superstructure reflections at 1/2{ooo} positions were observed, consistent with a structure tilted in antiphase only. In contrast, bulk ATN showed ±1/4(001) reflections which result from a combination of in-phase and antiphase tilting along the c axis as well as antiparallel cation displacements.

Original language	English (US)
Title of host publication	17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008
DOIs	https://doi.org/10.1109/ISAF.2008.4693931
State	Published - 2008
Event	17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008 - Santa Fe, NM, United States Duration: Feb 23 2008 → Feb 28 2008

Publication series

Name	IEEE International Symposium on Applications of Ferroelectrics
Volume	1

Other

Other	17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008
Country/Territory	United States
City	Santa Fe, NM
Period	2/23/08 → 2/28/08

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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10.1109/ISAF.2008.4693931

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@inproceedings{23c63e564139413991cf20a8ec11077e,

title = "CH027",

abstract = "Epitaxial AgTa0.5Nb0.5O3 (ATN) films deposited on (001)p SrRuO3/LaAlO3 and LaAlO3 by a chemical solution deposition technique have been characterised by transmission electron microscopy. The structure of the ATN layers has been compared with equivalent bulk ceramics. For thin ATN films, only superstructure reflections at 1/2{ooo} positions were observed, consistent with a structure tilted in antiphase only. In contrast, bulk ATN showed ±1/4(001) reflections which result from a combination of in-phase and antiphase tilting along the c axis as well as antiparallel cation displacements.",

author = "Y. Han and Reaney, {I. M.} and R. Johnson and Telli, {M. B.} and Tinberg, {D. S.} and I. Levin and S. Trolier-McKinstry",

note = "Copyright: Copyright 2009 Elsevier B.V., All rights reserved.; 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008 ; Conference date: 23-02-2008 Through 28-02-2008",

year = "2008",

doi = "10.1109/ISAF.2008.4693931",

language = "English (US)",

isbn = "1424427444",

series = "IEEE International Symposium on Applications of Ferroelectrics",

booktitle = "17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008",

}

Han, Y, Reaney, IM, Johnson, R, Telli, MB, Tinberg, DS, Levin, I & Trolier-McKinstry, S 2008, CH027. in 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008., 4693931, IEEE International Symposium on Applications of Ferroelectrics, vol. 1, 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008, Santa Fe, NM, United States, 2/23/08. https://doi.org/10.1109/ISAF.2008.4693931

TY - GEN

T1 - CH027

AU - Han, Y.

AU - Reaney, I. M.

AU - Johnson, R.

AU - Telli, M. B.

AU - Tinberg, D. S.

AU - Levin, I.

AU - Trolier-McKinstry, S.

PY - 2008

Y1 - 2008

N2 - Epitaxial AgTa0.5Nb0.5O3 (ATN) films deposited on (001)p SrRuO3/LaAlO3 and LaAlO3 by a chemical solution deposition technique have been characterised by transmission electron microscopy. The structure of the ATN layers has been compared with equivalent bulk ceramics. For thin ATN films, only superstructure reflections at 1/2{ooo} positions were observed, consistent with a structure tilted in antiphase only. In contrast, bulk ATN showed ±1/4(001) reflections which result from a combination of in-phase and antiphase tilting along the c axis as well as antiparallel cation displacements.

AB - Epitaxial AgTa0.5Nb0.5O3 (ATN) films deposited on (001)p SrRuO3/LaAlO3 and LaAlO3 by a chemical solution deposition technique have been characterised by transmission electron microscopy. The structure of the ATN layers has been compared with equivalent bulk ceramics. For thin ATN films, only superstructure reflections at 1/2{ooo} positions were observed, consistent with a structure tilted in antiphase only. In contrast, bulk ATN showed ±1/4(001) reflections which result from a combination of in-phase and antiphase tilting along the c axis as well as antiparallel cation displacements.

UR - http://www.scopus.com/inward/record.url?scp=58149486176&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=58149486176&partnerID=8YFLogxK

U2 - 10.1109/ISAF.2008.4693931

DO - 10.1109/ISAF.2008.4693931

M3 - Conference contribution

AN - SCOPUS:58149486176

SN - 1424427444

SN - 9781424427444

T3 - IEEE International Symposium on Applications of Ferroelectrics

BT - 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008

T2 - 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008

Y2 - 23 February 2008 through 28 February 2008

ER -

CH027

Abstract

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All Science Journal Classification (ASJC) codes

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