Characterization of Metal Surfaces by Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy

R. W. Hewitt, A. T. Shepard, W. E. Baitinger, Nicholas Winograd, G. L. Ott, W. N. Delgass

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

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Physics

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Chemistry

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Chemical Engineering