Characterization of Mg-Alloyed Zinc Oxide Thin Films for Memory Devices via Transmission Electron Microscopy Analyses

Ece Günay; V. Sebastian Calderon; Jackson Spurling; Jon Paul Maria; Elizabeth C. Dickey

doi:10.1093/mam/ozae044.594

Characterization of Mg-Alloyed Zinc Oxide Thin Films for Memory Devices via Transmission Electron Microscopy Analyses

Ece Günay, V. Sebastian Calderon, Jackson Spurling, Jon Paul Maria, Elizabeth C. Dickey

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	1192-1193
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	30
Issue number	2024
DOIs	https://doi.org/10.1093/mam/ozae044.594
State	Published - Jul 24 2024
Event	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024

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10.1093/mam/ozae044.594

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@article{3b8ffccd3d7e489c907cb6111794cc20,

title = "Characterization of Mg-Alloyed Zinc Oxide Thin Films for Memory Devices via Transmission Electron Microscopy Analyses",

author = "Ece G{\"u}nay and \{Sebastian Calderon\}, V. and Jackson Spurling and Maria, \{Jon Paul\} and Dickey, \{Elizabeth C.\}",

year = "2024",

month = jul,

day = "24",

doi = "10.1093/mam/ozae044.594",

language = "English (US)",

volume = "30",

pages = "1192--1193",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "2024",

note = "82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

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TY - JOUR

T1 - Characterization of Mg-Alloyed Zinc Oxide Thin Films for Memory Devices via Transmission Electron Microscopy Analyses

AU - Günay, Ece

AU - Sebastian Calderon, V.

AU - Spurling, Jackson

AU - Maria, Jon Paul

AU - Dickey, Elizabeth C.

PY - 2024/7/24

Y1 - 2024/7/24

UR - http://www.scopus.com/inward/record.url?scp=85215684632&partnerID=8YFLogxK

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U2 - 10.1093/mam/ozae044.594

DO - 10.1093/mam/ozae044.594

M3 - Conference article

AN - SCOPUS:85215684632

SN - 1431-9276

VL - 30

SP - 1192

EP - 1193

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 2024

T2 - 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024

Y2 - 28 July 2024 through 1 August 2024

ER -

Characterization of Mg-Alloyed Zinc Oxide Thin Films for Memory Devices via Transmission Electron Microscopy Analyses

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