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Characterization of ordered mesoporous silica films using small-angle neutron scattering and X-ray porosimetry
Bryan D. Vogt, Rajaram A. Pai, Hae Jeong Lee, Ronald C. Hedden, Christopher L. Soles, Wen Li Wu, Eric K. Lin, Barry J. Bauer, James J. Watkins
Research output: Contribution to journal › Article › peer-review
43
Scopus
citations