Characterization of the ultra-thin elastic layer by ultrasonic longitudinal reflection wave in the frequency domain

R. Zhang, M. X. Wang, X. Chen, W. W. Cao

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	376
Number of pages	1
Journal	Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument
Volume	22
Issue number	4
State	Published - Aug 2001

All Science Journal Classification (ASJC) codes

@article{754d2d0c1f6546ee8c507063ac98f663,

title = "Characterization of the ultra-thin elastic layer by ultrasonic longitudinal reflection wave in the frequency domain",

author = "R. Zhang and Wang, \{M. X.\} and X. Chen and Cao, \{W. W.\}",

year = "2001",

month = aug,

language = "English (US)",

volume = "22",

pages = "376",

journal = "Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument",

issn = "0254-3087",

publisher = "Science Press",

number = "4",

}

TY - JOUR

T1 - Characterization of the ultra-thin elastic layer by ultrasonic longitudinal reflection wave in the frequency domain

AU - Zhang, R.

AU - Wang, M. X.

AU - Chen, X.

AU - Cao, W. W.

PY - 2001/8

Y1 - 2001/8

UR - https://www.scopus.com/pages/publications/0035414034

UR - https://www.scopus.com/inward/citedby.url?scp=0035414034&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0035414034

SN - 0254-3087

VL - 22

SP - 376

JO - Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument

JF - Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument

IS - 4

ER -