@inproceedings{e1734ed73d7845b1b4dce2a8f8d9351e,
title = "Characterization of two E' center charge traps in conventionally grown thermal SiO2 on Si",
abstract = "We use electron spin resonance to characterize two E' variant charge traps in conventionally grown thermal SiO2.",
author = "Conley, \{J. F.\} and Lenahan, \{Patrick M.\} and Evans, \{H. L.\} and Lowry, \{R. K.\} and Morthorst, \{T. J.\}",
year = "1994",
month = jan,
day = "1",
language = "English (US)",
series = "European Solid-State Device Research Conference",
publisher = "IEEE Computer Society",
pages = "309--312",
editor = "Peter Ashburn and Chris Hill",
booktitle = "European Solid-State Device Research Conference",
address = "United States",
note = "24th European Solid State Device Research Conference, ESSDERC 1994 ; Conference date: 11-09-1994 Through 15-09-1994",
}