Chemical imaging of glass surfaces by mass spectrometry

Carlo G. Pantano, J. Berry, Nicholas Winograd

Research output: Contribution to journalArticlepeer-review

1 Scopus citations


The use of imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) is being explored as a means to characterize the lateral distribution of molecules on glass surfaces. This article details the basic elements of TOF-SIMS instrumentation. It also illustrates the power of the approach via examination of the mass spectra of coated and uncoated glass fibers.

Original languageEnglish (US)
Pages (from-to)22-23
Number of pages2
JournalGlass Researcher
Issue number1
StatePublished - 1999

All Science Journal Classification (ASJC) codes

  • General Chemical Engineering


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