Abstract
The use of imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) is being explored as a means to characterize the lateral distribution of molecules on glass surfaces. This article details the basic elements of TOF-SIMS instrumentation. It also illustrates the power of the approach via examination of the mass spectra of coated and uncoated glass fibers.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 22-23 |
| Number of pages | 2 |
| Journal | Glass Researcher |
| Volume | 9 |
| Issue number | 1 |
| State | Published - 1999 |
All Science Journal Classification (ASJC) codes
- General Chemical Engineering
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