Chromatic second harmonic imaging

We report a non-axial-scanning second harmonic imaging technique, in which the chromatic aberration of a Fresnel lens is exploited to focus different wavelengths of a fundamental beam into different axial positions to effectively realize axial scanning. Since the second harmonic signals at different axial positions are generated by different fundamental wavelengths and hence accordingly have different center wavelengths, they can be resolved and detected in parallel by using a spectrometer without axial mechanical scanning. We have demonstrated a system capable of achieving about 8 μm effective axial scanning range. Proof-of-concept imaging results are also presented.