Circuit design methodologies for test power reduction in nano-scaled technologies

Keyphrases

• Scalable Technology 100%
• Test Power 100%
• Handheld 33%
• Design Concerns 33%
• Circuitry 33%
• Dual Benefits 33%
• Electronic Devices 33%
• Self-testing 33%
• Average Power 33%
• Increased Reliability 33%
• Power Reduction 33%
• Increased Yield 33%
• Battery Life 33%
• Peak Power 33%
• Embedded Cores 33%

Engineering

• Circuit Design 100%
• Peak Power 50%
• Average Power 50%
• Built-in Self Test 50%
• Test Time 50%